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Osterman, Michael

Osterman, Michael
Senior Research Scientist
Director, CALCE Electronic Products and System Consortium
Center for Advanced Lifecycle Engineering


Dr. Michael Osterman (Ph.D., University of Maryland, 1991) is a Senior Research Scientist and the director of the CALCE Electronic Products and System Consortium at the University of Maryland. He heads the development of simulation assisted reliability assessment software for CALCE and simulation approaches for estimating time to failure of electronic hardware under test and field conditions. Dr. Osterman served as a subject matter expert on phase I and II of the Lead-free Manhattan Project sponsored by Office of Naval Research in conjunction with the Joint Defense Manufacturing Technical Panel (JDMTP). He has consulted with automotive, medical, defense, and industrial electronic companies on the transition to lead-free materials. He organized and chaired the International Symposium on Tin Whiskers from 2007 to 2013. He has written eight book chapters and over 120 articles. He is a senior member of IEEE and a member of ASME, IMAPS and SMTA

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A working group, chaired by Prof. Michael Pecht, developed an IEEE standard for PHM of electronic systems. January 26, 2018

Faculty Honors Barker
Department of Mechanical Engineering faculty celebrate the service of Professor Donald Barker at annual emeritus luncheon. September 30, 2013

Preeti Chauhan Wins Best Student Paper Award
Paper focuses on canary approach to electronics failure. May 9, 2012

CALCE Research Referenced by Huffington Post
Article on car acceleration problems utilizes research by Pecht, Sood, and Osterman January 27, 2012

ME / CALCE Students Receive Best Paper Award
Professor Pecht’s students honored at IMAPS Microelectronics Workshop. July 7, 2011

ME Students Receive Best Paper Award
Professor Pecht's students honored at IMAPS Microelectronics Workshop. June 17, 2011

Pecht to Deliver Keynote Address at IEEE Symposium
Lifetime Achievement Award recipient to discuss new approach to qualification testing. March 7, 2008