Don Barker of CALCE EPSC Earns Best Paper AwardProfessor of Mechanical Engineering Donald Barker of the CALCE Electronic Products and Systems Center (ESPC) received the 2006 Maurice Simpson Technical Editors Award from the Institute of Environmental Sciences and Technology (IEST) for his paper "Practical Assessment of Electronic Circuit Cards Under Mechanical Shock Loading." The paper was co-written by Thomas J. Stadterman, and will be published in the 2005 Jounal of the IEST. Formal recognition for this prestigious accomplishment will take place at the ESTECH 2006 Awards Recognition and Membership Luncheon on May 9 in Phoenix, Arizona.
In February 2006 Barker and Michael Freda of Sun Microsystems, Inc. won the “Best U.S. Paper for 2006” award from the IPC Printed Circuits Expo, APEX and Designer’s Summit 2006 Technical Program Committee for their paper “Predicting Plated Through Hole Life at Assembly and in the Field from Thermal Stress Data.”
Published April 15, 2006